Secondary Target EDXRF
Xenemetrix’s EX-6600 SDD Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the ultimate in sensitivity and selectivity. The Silicon Drift Detector (SDD) simultaneously delivers lower electronic noise and higher count rates which translates to higher energy resolution and faster results compared to a Si-PIN detector. Eight secondary targets provide maximum sensitivity for fast and precise quantification even in difficult matrices such as alloy, plastic and geological samples. Targets are fully customizable to achieve sub-ppm detection limits. The versatile EX-6600 SDD can analyze liquids, solids, slurries, powders, pellets and air filters and the analytical chamber accommodates samples of different shapes and sizes.
The integral design of the 10-position autosampler permits minimal operator intervention and allows automatic loading and unattended operation. This fast, accurate, easy-to-use instrument has robust hardware and powerful analytical software to achieve low detection limits. The Multi-Channel Acquisition resolution provides superior peak-to-background ratio for improved detector response.
Mining & Minerals; Metallurgical; Environmental; Petrochemical; Radioactive Materials Research