In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a Dual Beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging.The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive x-ray (EDX), electron backscatter diffraction (EBSD) and scanning-transmission electron microscope (STEM) detectors and allow micromachining of micromechanical specimens, TEM lamellae preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.

Extended TitleNL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
Changes
Section:
IV.2.2)
Previous text:
2019-07-08
New text:
2019-07-18
Section:
IV.2.7)
Previous text:
2019-07-09
New text:
2019-07-19
Deadline Date2019-07-18
Publication Date2019-06-17
CountryNetherlands
Procurement StatusAmended
TypeOpen procedure
Contract TypeSupplies
Award CriteriaThe most economic tender
OrganisationEuropean Commission, JRC — Joint Research Centre, JRC.G — Nuclear Safety and Security (Karlsruhe), JRC.G.I.4 - Nuclear Reactor Safety and Emergency Preparedness
Attention OfAneta Jukneviciene
AddressWesterduinweg 3
TownPetten
Postal Code1755 LE
Class Code38512100
Class DescriptionIon microscopes
SourceOffice for Official Publications of the European Communities - Tenders electronic daily (Ted)

Version of 2019-06-07

NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)

In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a Dual Beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging. The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive x-ray (EDX), electron backscatter diffraction (EBSD) and scanning-transmission electron microscope (STEM) detectors and allow micromachining of micromechanical specimens, TEM lamellae preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.

Extended TitleNL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
Changes
Section:
I.3)
Previous text:

The procurement documents are available for unrestricted and full direct access, free of charge, at: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716

Additional information can be obtained from the abovementioned address

Tenders or requests to participate must be submitted electronically via: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716

Tenders or requests to participate must be submitted to the abovementioned address

New text:

The procurement documents are available for unrestricted and full direct access, free of charge, at: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716

Additional information can be obtained from the abovementioned address.

Tenders or requests to participate must be submitted as stated in the procurement documents.

Deadline Date2019-07-08
Publication Date2019-06-07
CountryNetherlands
Procurement StatusAmended
TypeOpen procedure
Contract TypeSupplies
Award CriteriaThe most economic tender
OrganisationEuropean Commission, JRC — Joint Research Centre, JRC.G — Nuclear Safety and Security (Karlsruhe), JRC.G.I.4 — Nuclear Reactor Safety and Emergency Preparedness
Attention OfAneta Jukneviciene
AddressWesterduinweg 3
TownPetten
Postal Code1755 LE
Class Code38512100
Class DescriptionIon microscopes
SourceOffice for Official Publications of the European Communities - Tenders electronic daily (Ted)

Version of 2019-06-03

NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)

In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a Dual Beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging. The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive x-ray (EDX), Electron Backscatter Diffraction (EBSD) and Scanning-Transmission Electron Microscope (STEM) detectors and allow micro-machining of micro-mechanical specimens, TEM lamellae preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.

Extended TitleNL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
Extended Description

NL-Petten: Supply and maintenance of a dual beam plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM).

Deadline Date2019-07-08
Publication Date2019-06-03
CountryNetherlands
Procurement StatusActive
TypeOpen procedure
Contract TypeSupplies
Award CriteriaThe most economic tender
Value2150000.00
OrganisationEuropean Commission, JRC — Joint Research Centre, JRC.G — Nuclear Safety and Security (Karlsruhe), JRC.G.I.4 — Nuclear Reactor Safety and Emergency Preparedness
Attention OfAneta Jukneviciene
AddressWesterduinweg 3
TownPetten
Postal Code1755 LE
Class Code38510000
Class DescriptionMicroscopes
SourceOffice for Official Publications of the European Communities - Tenders electronic daily (Ted)

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