In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a dual beam microscope (pFIB-SEM) featuring a Xenon plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging. The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive X-ray (EDX), electron backscatter diffraction (EBSD) and scanning-transmission electron microscope (STEM) detectors and allow micromachining of micromechanical specimens, TEM lamellae preparation of hard and soft materials, and 3D reconstructions of analysed volumes. The choice for a plasma ion source instead of the most common liquid metal ion source derives from the need to avoid metal contamination due to ion implantation during sample preparation (fabrication of micro-specimens or TEM lamellae).

Extended TitleNL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope
Extended Description

NL-Petten: supply and maintenance of a dual beam plasma focused ion beam — field emission scanning electron microscope.

Deadline Date2019-10-31
Publication Date2019-09-24
CountryNetherlands
Procurement StatusActive
TypeOpen procedure
Contract TypeSupplies
Award CriteriaThe most economic tender
Value2150000.00
OrganisationEuropean Commission, JRC — Joint Research Centre, JRC.G — Nuclear Safety and Security (Karlsruhe), JRC.G.I.4 — Nuclear Reactor Safety and Emergency Preparedness
Attention OfAneta Jukneviciene
AddressWesterduinweg 3
TownPetten
Postal Code1755 LE
Class Code38512100
Class DescriptionIon microscopes
SourceOffice for Official Publications of the European Communities - Tenders electronic daily (Ted)

Version of 2019-08-29

NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)

In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a dual beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging.The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive X-ray (EDX), electron backscatter diffraction (EBSD) and scanning-transmission electron microscope (STEM) detectors and allow micro-machining of micro-mechanical specimens, TEM lamella preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.

Extended TitleNL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
Extended Description

NL-Petten: supply and maintenance of a dual beam plasma focused ion beam — field emission scanning electron microscope (pFIB — SEM).

Publication Date2019-08-29
CountryNetherlands
Procurement StatusAwarded
TypeOpen procedure
Contract TypeSupplies
Award CriteriaThe most economic tender
OrganisationEuropean Commission, JRC — Joint Research Centre, JRC.G — Nuclear Safety and Security (Karlsruhe), JRC.G.I.4 — Nuclear Reactor Safety and Emergency Preparedness
Attention OfAneta Jukneviciene
AddressWesterduinweg 3
TownPetten
Postal Code1755 LE
Class Code38510000
Class DescriptionMicroscopes
SourceOffice for Official Publications of the European Communities - Tenders electronic daily (Ted)

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